Back to Search
Start Over
The middle-income trap and the middle-technology trap in Latin America–practice comparison based on East Asian perspective.
- Source :
- Asian Review of Political Economy; 8/5/2024, Vol. 3 Issue 1, p1-24, 24p
- Publication Year :
- 2024
-
Abstract
- Most Latin American countries entered the ranks of middle-income levels almost simultaneously with Japan and South Korea. However, while Japan and South Korea embarked on the path of economic development through technological innovation and industrial upgrading, Latin America fell into the middle-income trap. By examining the history of industrial and technological development in Brazil, Argentina, and Mexico, three representative countries in Latin America, this paper finds that the fundamental reasons for Latin America falling into the middle-income trap lie in the tension between the choice of industrialization path and primitive accumulation, as well as the institutional deficiencies in technology and industrial development. Latin America, which has fallen into the middle-income trap, finds it hard to upgrade its technology and is trapped in premature industrialization and the middle-technology trap. It can be said that Latin America has fallen into a double trap, which reinforces each other and forms a solid trap pattern. The warning from the Latin American experience is that late-developing countries need to maintain an open attitude during the process of technological catching up, build a complete technological innovation system, enhance industrial and technological governance capabilities, and seize the window of opportunity for technological and industrial upgrading. Otherwise, there is a significant risk of falling into the middle-income trap and even the double trap. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 27315835
- Volume :
- 3
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Asian Review of Political Economy
- Publication Type :
- Academic Journal
- Accession number :
- 178836946
- Full Text :
- https://doi.org/10.1007/s44216-024-00031-7