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Elevated thermal stability of the dielectric properties of CaMoO4–TiO2 composites under temperature variations.

Authors :
Nogueira, Francisco Enilton Alves
do Nascimento, João Paulo Costa
Abreu, Tallison Oliveira
Abreu, Roterdan Fernandes
Ghosh, Anupama
do Carmo, Felipe Felix
da Silva, Marcelo Antonio Santos
da Silva, Ronaldo Santos
Trukhanov, S. V.
Zhou, Di
Singh, C.
Sombra, Antonio Sergio Bezerra
Source :
Journal of Materials Science: Materials in Electronics; Jul2024, Vol. 35 Issue 21, p1-11, 11p
Publication Year :
2024

Abstract

In this article, the dielectric properties of the ceramic CaMoO<subscript>4</subscript> (CMO) with additions of 0, 8, 12, and 20% by mass (wt %) of TiO<subscript>2</subscript> in the radiofrequency (RF) region were studied. X-ray diffraction analysis showed that no secondary phases formed after the addition of TiO<subscript>2</subscript>. Scanning electron microscopy was used to analyse the effects on the morphology of the CMO. Complex Impedance Spectroscopy (CIS) was performed to evaluate the electrical properties of the materials, while temperature coefficient of capacitance (TCC) analysis showed that at 10 kHz, CMO12 (CMO with 12 wt % TiO<subscript>2</subscript>) presented a TCC equal to zero, demonstrating that this material is thermally stable at this frequency. The activation energy (E<subscript>a</subscript>) was calculated by AC conductivity and imaginary part of the electric modulus (M″) at different temperatures. The E<subscript>a</subscript> values were close, indicating that the thermally activated conduction process is the same. Moreover, the addition of TiO<subscript>2</subscript> resulted in a decrease in the E<subscript>a</subscript>, implying an increased conductivity of the material. The results obtained show that the materials evaluated would be interesting candidates for application in electronic circuits that operate in the radiofrequency region. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09574522
Volume :
35
Issue :
21
Database :
Complementary Index
Journal :
Journal of Materials Science: Materials in Electronics
Publication Type :
Academic Journal
Accession number :
178726276
Full Text :
https://doi.org/10.1007/s10854-024-13227-7