Cite
P‐174: Improvement of Etching Pattern in TOE Structure Display Based on Pattern Design and Stack‐Up Optimization.
MLA
Yi, Xinrong, et al. “P‐174: Improvement of Etching Pattern in TOE Structure Display Based on Pattern Design and Stack‐Up Optimization.” SID Symposium Digest of Technical Papers, vol. 55, no. 1, June 2024, pp. 2050–52. EBSCOhost, https://doi.org/10.1002/sdtp.18003.
APA
Yi, X., Zhang, S., Zhang, L., Li, H., Yang, X., Dang, P., & Liu, T. (2024). P‐174: Improvement of Etching Pattern in TOE Structure Display Based on Pattern Design and Stack‐Up Optimization. SID Symposium Digest of Technical Papers, 55(1), 2050–2052. https://doi.org/10.1002/sdtp.18003
Chicago
Yi, Xinrong, Shuang Zhang, Lei Zhang, Hui Li, Xinshuai Yang, Pengle Dang, and Tongmin Liu. 2024. “P‐174: Improvement of Etching Pattern in TOE Structure Display Based on Pattern Design and Stack‐Up Optimization.” SID Symposium Digest of Technical Papers 55 (1): 2050–52. doi:10.1002/sdtp.18003.