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P‐234: Late‐News Poster: A Data‐Centric Approach to Minimize Defect Leakage in an AI‐based Automated Surface Inspection System for Display Manufacturing Process.

Authors :
Kim, Seung-Gi
Jo, SungHoon
Kim, HanEol
Yoo, DongGon
Source :
SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, p1609-1612, 4p
Publication Year :
2024

Abstract

This study advances Surface Inspection (SI) in display panel manufacturing using a data‐centric approach, addressing high gray zone rates and data discrepancies. We employed a data flywheel method with dual labeling to improve dataset quality. Results show expanded automated coverage and enhanced classification, reducing defect leakage, demonstrating AI's impact in smart manufacturing processes. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0097966X
Volume :
55
Issue :
1
Database :
Complementary Index
Journal :
SID Symposium Digest of Technical Papers
Publication Type :
Academic Journal
Accession number :
178715684
Full Text :
https://doi.org/10.1002/sdtp.17870