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P‐14: High Mobility and High Light Stability Oxide Back‐Channel‐Etched TFT and Application to High‐End LCD NB Production.
- Source :
- SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, p1414-1417, 4p
- Publication Year :
- 2024
-
Abstract
- A high mobility (29 cm2 /Vs) and high light stability oxide thin‐film transistor (TFT) with 8 mask back channel etched (BCE) structure has been fabricated. Remarkable enhancement in negative gate‐bias thermal stress with illumination has been achieved, resulting in a threshold voltage (Vth) shift of ‐0.01 V after 1 hour. A 16.0 inch WQHD 240Hz LCD NB has been developed using high mobility and high light stability oxide TFT in G8.5. [ABSTRACT FROM AUTHOR]
- Subjects :
- THERMAL stresses
TRANSISTORS
OXIDES
THIN film transistors
LIGHTING
Subjects
Details
- Language :
- English
- ISSN :
- 0097966X
- Volume :
- 55
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- SID Symposium Digest of Technical Papers
- Publication Type :
- Academic Journal
- Accession number :
- 178715627
- Full Text :
- https://doi.org/10.1002/sdtp.17813