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P‐14: High Mobility and High Light Stability Oxide Back‐Channel‐Etched TFT and Application to High‐End LCD NB Production.

Authors :
Huang, Jie
Yuan, Guangcai
Li, Zhengliang
Ning, Ce
Huang, Rui
Meng, Detian
Li, Feifei
Fu, Xu
Hu, Hehe
Huang, Zhonghao
Wu, Xu
Ning, Zhiyong
Wang, Rui
Yang, Yutong
Source :
SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, p1414-1417, 4p
Publication Year :
2024

Abstract

A high mobility (29 cm2 /Vs) and high light stability oxide thin‐film transistor (TFT) with 8 mask back channel etched (BCE) structure has been fabricated. Remarkable enhancement in negative gate‐bias thermal stress with illumination has been achieved, resulting in a threshold voltage (Vth) shift of ‐0.01 V after 1 hour. A 16.0 inch WQHD 240Hz LCD NB has been developed using high mobility and high light stability oxide TFT in G8.5. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0097966X
Volume :
55
Issue :
1
Database :
Complementary Index
Journal :
SID Symposium Digest of Technical Papers
Publication Type :
Academic Journal
Accession number :
178715627
Full Text :
https://doi.org/10.1002/sdtp.17813