74‐3: Regular Reflectance and Transmittance Measured by the Annulus Source Method.

Prior work showed how the annulus source method could extract the true regular reflectance component from a reflective display in the presence of multiple scattering components. This study extends this work by demonstrating the capability of this method to measure the regular reflectance and transmittance of emissive, transparent, and augmented reality displays. [ABSTRACT FROM AUTHOR]