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Virtualized Fault Injection Framework for ISO 26262-Compliant Digital Component Hardware Faults.

Authors :
Almeida, Rui
Silva, Vitor
Cabral, Jorge
Source :
Electronics (2079-9292); Jul2024, Vol. 13 Issue 14, p2787, 17p
Publication Year :
2024

Abstract

Simulation-based Fault Injection (FI) is crucial for validating system behaviour in safety-critical applications, such as the automotive industry. The ISO 26262 standard's Part 11 extension provides failure modes for digital components, driving the development of new fault models to assess software-implemented mechanisms against random hardware failures (RHF). This paper proposes a Fault Injection framework, QEFIRA, and shows its ability to achieve the failure modes proposed by Part 11 of the ISO 26262 standard and estimate relevant metrics for safety mechanisms. QEFIRA uses QEMU to inject permanent and transient faults during runtime, whilst logging the system state and providing automatic post-execution analysis. Complemented with a confusion matrix, it allows us to gather standard compliant metrics to characterise and evaluate different designs in the early stages of development. Comparatively to the native QEMU implementation, the tool only shows a slowdown of 1.4 × for real-time microcontroller-based applications. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20799292
Volume :
13
Issue :
14
Database :
Complementary Index
Journal :
Electronics (2079-9292)
Publication Type :
Academic Journal
Accession number :
178691708
Full Text :
https://doi.org/10.3390/electronics13142787