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Thermally-aware circuit model and performance analysis of MLGNR for nano-interconnect application.

Authors :
Sharma, Himanshu
Sandha, Karmjit Singh
Source :
Analog Integrated Circuits & Signal Processing; Jul2024, Vol. 120 Issue 1, p71-81, 11p
Publication Year :
2024

Abstract

This paper explores the influence of temperature on the scattering mechanism of multilayer graphene nanoribbon (MLGNR). A thermally aware electrical ESC model along with mathematical computations is presented for evaluating the parasitic and reports the performance analysis dependent on temperature of the MLGNR at global interconnect length for 16 nm, 22 nm, and 32 nm nodes of technology in terms of power dissipation, delay, and power delay product (PDP). It was examined that with rising temperature, there is a strident decrease in the mean free path of GNR interconnect, which further influence its own resistance at variable global lengths (500‒2000 μm) for all three technology nodes. The simulation program with integrated circuit (SPICE) emphasis simulation tool is used to estimate and compare the performance of MLGNR in terms of power dissipation, signal delay and PDP for three different nodes of technology. It is revealed from the outcomes that the propagation delay and PDP increase at long interconnects (2000 μm) over a temperature range of 200 to 500 K for deep submicron technology nodes (16, 22, and 32 nm). Further, based on ITRS 2013, the analytical and simulated results are obtained at global interconnect length (2000 μm) for 16 nm technology node in the 200–500 K temperature range of MLGNR. The simulation and analytical results show that the outcomes of the two models are very similar. The models' trends show an increase in delay with increasing temperature levels (200‒500 K) 16 nm technology node. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09251030
Volume :
120
Issue :
1
Database :
Complementary Index
Journal :
Analog Integrated Circuits & Signal Processing
Publication Type :
Academic Journal
Accession number :
178529747
Full Text :
https://doi.org/10.1007/s10470-024-02254-3