Back to Search Start Over

Digital Forensics for Analyzing Cyber Threats in the XR Technology Ecosystem within Digital Twins.

Authors :
Oh, Subin
Shon, Taeshik
Source :
Electronics (2079-9292); Jul2024, Vol. 13 Issue 13, p2653, 21p
Publication Year :
2024

Abstract

Recently, advancements in digital twin and extended reality (XR) technologies, along with industrial control systems (ICSs), have driven the transition to Industry 5.0. Digital twins mimic and simulate real-world systems and play a crucial role in various industries. XR provides innovative user experiences through virtual reality (VR), augmented reality (AR), and mixed reality (MR). By integrating digital twin simulations into XR devices, these technologies are utilized in various industrial fields. However, the prevalence of XR devices has increased the exposure to cybersecurity threats in ICS and digital twin environments. Because XR devices are connected to networks, the control and production data they process are at risk of being exposed to cyberattackers. Attackers can infiltrate XR devices through malicious code or hacking attacks to take control of the ICS or digital twin or paralyze the system. Therefore, this study emphasizes the cybersecurity threats in the ecosystem of XR devices used in ICSs and conducts research based on digital forensics. It identifies potentially sensitive data and artifacts in XR devices and proposes secure and reliable security response measures in the Industry 5.0 environment. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20799292
Volume :
13
Issue :
13
Database :
Complementary Index
Journal :
Electronics (2079-9292)
Publication Type :
Academic Journal
Accession number :
178412754
Full Text :
https://doi.org/10.3390/electronics13132653