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Fast Noise Level Estimation via the Similarity within and between Patches.
- Source :
- Electronics (2079-9292); Jul2024, Vol. 13 Issue 13, p2556, 14p
- Publication Year :
- 2024
-
Abstract
- Patch level-based noise level estimation (NLE) is often inaccurate and inefficient because of the harsh criteria required to select a small number of homogeneous patches. In this paper, a fast image NLE method based on a global search for similar pixels is proposed to solve the above problem. Specifically, the mean square distance (MSD) is first expressed in the form of the standard deviation (std) and mean value of image patches. Afterward, the two values, std and mean, are calculated and stored in advance. Then, a 2D statistical histogram and summed area table are adopted to speed up the search for similar patches. Further, the most similar pixels are selected from similar patches to obtain an initial estimation. Finally, we correct the deviation of the initial estimation by re-injecting noise for secondary estimation. Experimental results show that the proposed method outperforms the state-of-the-art techniques in fast NLE and guided denoising. [ABSTRACT FROM AUTHOR]
- Subjects :
- PIXELS
NOISE
STANDARD deviations
IMAGE denoising
PROBLEM solving
Subjects
Details
- Language :
- English
- ISSN :
- 20799292
- Volume :
- 13
- Issue :
- 13
- Database :
- Complementary Index
- Journal :
- Electronics (2079-9292)
- Publication Type :
- Academic Journal
- Accession number :
- 178412657
- Full Text :
- https://doi.org/10.3390/electronics13132556