Exploring the Correlation Between Surface Roughness, Surface Energy, Nano-indentation, Electrical Properties, and Magnetic Characteristics of Annealed Co40Fe40Dy20 Thin Films Deposited on Si(100) Substrates.

MLA

Liu, Wen-Jen, et al. “Exploring the Correlation Between Surface Roughness, Surface Energy, Nano-Indentation, Electrical Properties, and Magnetic Characteristics of Annealed Co40Fe40Dy20 Thin Films Deposited on Si(100) Substrates.” Journal of Electronic Materials, vol. 53, no. 8, Aug. 2024, pp. 4498–511. EBSCOhost, https://doi.org/10.1007/s11664-024-11237-z.

APA

Liu, W.-J., Chang, Y.-H., Hsu, S.-T., Fern, C.-L., Chen, Y.-T., Tsao, S.-Y., & Lin, S.-H. (2024). Exploring the Correlation Between Surface Roughness, Surface Energy, Nano-indentation, Electrical Properties, and Magnetic Characteristics of Annealed Co40Fe40Dy20 Thin Films Deposited on Si(100) Substrates. Journal of Electronic Materials, 53(8), 4498–4511. https://doi.org/10.1007/s11664-024-11237-z

Chicago

Liu, Wen-Jen, Yung-Huang Chang, Shuo-Ting Hsu, Chi-Lon Fern, Yuan-Tsung Chen, Shin-Ying Tsao, and Shih-Hung Lin. 2024. “Exploring the Correlation Between Surface Roughness, Surface Energy, Nano-Indentation, Electrical Properties, and Magnetic Characteristics of Annealed Co40Fe40Dy20 Thin Films Deposited on Si(100) Substrates.” Journal of Electronic Materials 53 (8): 4498–4511. doi:10.1007/s11664-024-11237-z.