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P‐11.6: Minimal efficiency degradation and elevated radiometric power density of Ultraviolet‐A micro‐LED with homoepitaxial structure.

Authors :
Liu, Yibo
Wang, Guobin
Feng, Feng
Li, Zichun
Liu, Zhaoyong
Xu, Ke
Kwok, Hoi Sing
Liu, Zhaojun
Source :
SID Symposium Digest of Technical Papers; Apr2024 Suppl 1, Vol. 55 Issue 1, p1305-1308, 4p
Publication Year :
2024

Abstract

As display technology continues to advance, UVA micro‐LEDs are becoming increasingly important in a variety of display and beyond‐display applications. In this study, we investigate the optoelectronic characteristics of UVA micro‐LEDs based on a homogeneously epitaxial structure on freestanding gallium nitride (GaN) substrates. The device exhibits a central wavelength of 390 nm, positioned at the overlap of UVA and visible light spectra. It demonstrates an impressively low ideality factor of 1.49 at 2.86 V and a series resistance of 9.88 Ω beyond 3 V. Optically, our device shows virtually no wavelength shift across a wide current density range of 0.1‐1000 A/cm2 , indicating exceptional optical stability and color accuracy. The emitted light is typical purple, reaching an expansive color gamut of 115.3% of Rec. 2020. Furthermore, the GaN‐on‐GaN structure, with its superior crystal structure and heat dissipation properties, results in a very low droop ratio in EQE. This ensures sustained high‐ power output at high current densities, showcasing great potential in applications such as 3D printing, maskless photolithography, and fluorescence tagging. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0097966X
Volume :
55
Issue :
1
Database :
Complementary Index
Journal :
SID Symposium Digest of Technical Papers
Publication Type :
Academic Journal
Accession number :
178132562
Full Text :
https://doi.org/10.1002/sdtp.17348