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55‐1: Invited Paper: Yield and manufacturing challenges for microLED micro‐displays.
- Source :
- SID Symposium Digest of Technical Papers; Apr2024 Suppl 1, Vol. 55 Issue 1, p481-483, 3p
- Publication Year :
- 2024
-
Abstract
- In this paper, we discuss microLED display yield and manufacturing challenges related to the CMOS integration as well as epi‐defectivity. Based on those considerations, we show the MICLEDI approach how to address them in a 300mm foundry compatible integration flow. [ABSTRACT FROM AUTHOR]
- Subjects :
- FOUNDRIES
Subjects
Details
- Language :
- English
- ISSN :
- 0097966X
- Volume :
- 55
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- SID Symposium Digest of Technical Papers
- Publication Type :
- Academic Journal
- Accession number :
- 178132331
- Full Text :
- https://doi.org/10.1002/sdtp.17117