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21‐1: Quantifying Localized Trap Evolution in Blue TADF OLED.
- Source :
- SID Symposium Digest of Technical Papers; Apr2024 Suppl 1, Vol. 55 Issue 1, p177-180, 4p
- Publication Year :
- 2024
-
Abstract
- Thermally activated delayed fluorescent (TADF) emitters attract interest as organic light‐emitting diode (OLED) materials with potentially 100% internal quantum efficiency (IQE). Their application in commercial displays is still hindered due to the not yet sufficient operational stability. We analyze the degradation mechanism in a TADF OLED by combining electro‐optical characterization and device simulations. We find that two trap states are being created at the HTL/EML interface during initial degradation. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 0097966X
- Volume :
- 55
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- SID Symposium Digest of Technical Papers
- Publication Type :
- Academic Journal
- Accession number :
- 178132245
- Full Text :
- https://doi.org/10.1002/sdtp.17031