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Optimized DM-RS Configuration for Improved 5G New Radio Network Capacity and Performance.

Authors :
Tomić, Igor
Drajić, Dejan
Ivaniš, Predrag
Savković, Uroš
Tešić, Djordje
Lorić, Aleksandar
Source :
Electronics (2079-9292); Jun2024, Vol. 13 Issue 11, p2028, 16p
Publication Year :
2024

Abstract

Network load in mobile networks is continuously growing, putting pressure on mobile operators to deliver target network performance and user experience. This paper focuses on network capacity improvement through increased spectral efficiency, which can be achieved with overhead reduction by optimizing the demodulation reference signal (DM-RS) configuration, which is one of the channels/reference signals with the largest contribution to overhead. In a high-speed scenario, the Doppler effect noticeably influences the temporal nature of the channel such that a channel interpolation process is required within a slot. However, increasing the number of symbols used for DM-RS has a negative impact on capacity. The Doppler effect was analyzed for various 5G NR configurations of operating frequency and subcarrier spacing (SCS), and various use cases were considered using user equipment (UE) speed as the main parameter. For suitable use cases, the DM-RS configuration was optimized in networks with live traffic. The impact of the configuration change on 5G/NR spectral efficiency, user experience and link adaptation performance was assessed through a deep-dive analysis of active measurements, available performance Management (PM) counters and key performance indicators. An optimized DM-RS configuration is proposed, and it is demonstrated to achieve gains of 5–15%, depending on the metric used, use case analyzed, network load, traffic mix and other relevant network characteristics such as topology and clutter type. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20799292
Volume :
13
Issue :
11
Database :
Complementary Index
Journal :
Electronics (2079-9292)
Publication Type :
Academic Journal
Accession number :
177857134
Full Text :
https://doi.org/10.3390/electronics13112028