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Fourier–Hankel–Abel Nyquist-limited tomography: A spherical harmonic basis function approach to tomographic velocity-map image reconstruction.

Authors :
Sparling, Chris
Rajak, Debobrata
Blanchet, Valérie
Mairesse, Yann
Townsend, Dave
Source :
Review of Scientific Instruments; May2024, Vol. 95 Issue 5, p1-15, 15p
Publication Year :
2024

Abstract

A new method for the fully generalized reconstruction of three-dimensional (3D) photoproduct distributions from velocity-map imaging (VMI) projection data is presented. This approach, dubbed Fourier–Hankel–Abel Nyquist-limited TOMography (FHANTOM), builds on recent previous work in tomographic image reconstruction [C. Sparling and D. Townsend, J. Chem. Phys. 157, 114201 (2022)] and takes advantage of the fact that the distributions produced in typical VMI experiments can be simply described as a sum over a small number of spherical harmonic functions. Knowing the solution is constrained in this way dramatically simplifies the reconstruction process and leads to a considerable reduction in the number of projections required for robust tomographic analysis. Our new method significantly extends basis set expansion approaches previously developed for the reconstruction of photoproduct distributions possessing an axis of cylindrical symmetry. FHANTOM, however, can be applied generally to any distribution—cylindrically symmetric or otherwise—that can be suitably described by an expansion in spherical harmonics. Using both simulated and real experimental data, this new approach is tested and benchmarked against other tomographic reconstruction strategies. In particular, the reconstruction of photoelectron angular distributions recorded in a strong-field ionization regime—marked by their extensive expansion in terms of spherical harmonics—serves as a key test of the FHANTOM methodology. With the increasing use of exotic optical polarization geometries in photoionization experiments, it is anticipated that FHANTOM and related reconstruction techniques will provide an easily accessible and relatively low-cost alternative to more advanced 3D-VMI spectrometers. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00346748
Volume :
95
Issue :
5
Database :
Complementary Index
Journal :
Review of Scientific Instruments
Publication Type :
Academic Journal
Accession number :
177608880
Full Text :
https://doi.org/10.1063/5.0206415