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Table of Contents.
- Source :
- IEEE Transactions on Semiconductor Manufacturing; May2024, Vol. 37 Issue 2, pC1-C4, 4p
- Publication Year :
- 2024
-
Abstract
- The document is the table of contents for the May 2024 issue of the IEEE Transactions on Semiconductor Manufacturing. It includes papers on various topics such as yield modeling, analysis, and enhancement, advanced processing, advanced process control, equipment and automation technology, non-silicon materials, emerging areas, and environment, safety, and health. The articles cover subjects such as chip-scale chemical mechanical polishing, threshold voltage deviation monitoring, curvilinear standard cell design, fabrication of silicon nanocone arrays, improving the reliability of through silicon vias, energy consumption and carbon emission reduction in HVAC systems, low-k silicon dioxide synthesis, chemical mechanical polishing of diamond epitaxial layers, conditional variable selection based on deep learning, and eco-friendly dry-cleaning and diagnostics of silicon dioxide deposition chambers. The document also includes an announcement for the call for nominations for the 2024 IEEE EDS Early Career Award. [Extracted from the article]
- Subjects :
- EPITAXIAL layers
DYNAMIC random access memory
DEEP learning
LICENSE agreements
Subjects
Details
- Language :
- English
- ISSN :
- 08946507
- Volume :
- 37
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Semiconductor Manufacturing
- Publication Type :
- Academic Journal
- Accession number :
- 177104212
- Full Text :
- https://doi.org/10.1109/TSM.2024.3378550