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位移损伤效应对AlGaN/GaN HEMT器件的影响.

Authors :
陈柏炜
孙常皓
马腾
宋宏甲
王金斌
彭超
张战刚
雷志锋
梁朝辉
钟向丽
Source :
Atomic Energy Science & Technology; Dec2023, Vol. 57 Issue 12, p2274-2280, 7p
Publication Year :
2023

Abstract

<i>Copyright of Atomic Energy Science & Technology is the property of Editorial Board of Atomic Energy Science & Technology and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)

Details

Language :
Chinese
ISSN :
10006931
Volume :
57
Issue :
12
Database :
Complementary Index
Journal :
Atomic Energy Science & Technology
Publication Type :
Academic Journal
Accession number :
176481526
Full Text :
https://doi.org/10.7538/yzk.2023.youxian.0555