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SiO2f/SiO2 composite grinding characteristics based on maximum undistorted chip thickness.

Authors :
Dong, Zhigang
Liu, Shucheng
Kang, Renke
Bao, Yan
Source :
Materials & Manufacturing Processes; 2024, Vol. 39 Issue 7, p1009-1018, 10p
Publication Year :
2024

Abstract

The thickness of the maximum undistorted chip (a<subscript>gmax</subscript>) is a crucial component of the machining arguments and significantly affects the quality of the grind. For the purpose of investigating the impact of the a<subscript>gmax</subscript> on the grinding removal properties of SiO<subscript>2f</subscript>/SiO<subscript>2</subscript> composites, grinding experiments of SiO<subscript>2f</subscript>/SiO<subscript>2</subscript> composites were conducted. The findings indicate that crack propagation, fiber cracking, matrix breaking, and interface debonding are the primary removal modes of SiO<subscript>2f</subscript>/SiO<subscript>2</subscript> composites. Grinding force, surface roughness, and chip size all have a positive correlation with the maximum undeformed chip thickness. Surface brittle fracture brought on by SiO<subscript>2</subscript> fiber microcrack results in little surface roughness. The surface quality degrades when bending fracture and compression fracture take place. Controlling the a<subscript>gmax</subscript> can enhance the grinding surface quality of SiO<subscript>2f</subscript>/SiO<subscript>2</subscript> composites. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10426914
Volume :
39
Issue :
7
Database :
Complementary Index
Journal :
Materials & Manufacturing Processes
Publication Type :
Academic Journal
Accession number :
176395598
Full Text :
https://doi.org/10.1080/10426914.2023.2254366