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Ir Transparency of Thin Bismuth Films.
- Source :
- Optics & Spectroscopy; Oct2023, Vol. 131 Issue 10, p1087-1092, 6p
- Publication Year :
- 2023
-
Abstract
- The infrared transmission and reflection spectra of a series of samples of bismuth films of different thicknesses on identical single-crystal silicon substrates were measured. Transmission and reflection oscillations caused by interference on the film thickness are investigated. Properties of Si-plates are estimated. Refractive index and absorption index of bismuth are calculated. [ABSTRACT FROM AUTHOR]
- Subjects :
- THIN films
REFRACTIVE index
BISMUTH
Subjects
Details
- Language :
- English
- ISSN :
- 0030400X
- Volume :
- 131
- Issue :
- 10
- Database :
- Complementary Index
- Journal :
- Optics & Spectroscopy
- Publication Type :
- Academic Journal
- Accession number :
- 176354299
- Full Text :
- https://doi.org/10.1134/S0030400X23100223