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Machine Learning Refinement of In Situ Images Acquired by Low Electron Dose LC-TEM.

Authors :
Katsuno, Hiroyasu
Kimura, Yuki
Yamazaki, Tomoya
Takigawa, Ichigaku
Source :
Microscopy & Microanalysis; Feb2024, Vol. 30 Issue 1, p77-84, 8p
Publication Year :
2024

Details

Language :
English
ISSN :
14319276
Volume :
30
Issue :
1
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
176064858
Full Text :
https://doi.org/10.1093/micmic/ozad142