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Thin-film Silicon Growth by Plasma-enhanced CVD : Gas-phase, Surface and In-film Reactions for High-quality Film Formation.

Authors :
Shota NUNOMURA
Michio KONDO
Source :
Vacuum & Surface Science; 2024, Vol. 67 Issue 2, p44-51, 8p
Publication Year :
2024

Abstract

We overview plasma-enhanced chemical vaper deposition (PECVD) of high-quality thin-film silicon. In PECVD, such a film is grown by the deposition of precursors, which is generated by the gas-phase reactions of source gases in plasma. The growth of the film depends on the surface reactions of precursors and the reactions in the growing film, i.e., in-film reactions, which influences the film structure and properties. The in-film reactions also take place after the growth, i.e., post-growth annealing. So, the reactions should be properly controlled throughout the growth and annealing for the high-quality film formation. Here, the growth kinetics and related reactions are presented for devicegrade hydrogenated amorphous silicon (a-Si:H) films. [ABSTRACT FROM AUTHOR]

Details

Language :
Chinese
ISSN :
24335835
Volume :
67
Issue :
2
Database :
Complementary Index
Journal :
Vacuum & Surface Science
Publication Type :
Academic Journal
Accession number :
175971192
Full Text :
https://doi.org/10.1380/vss.67.44