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Thin-film Silicon Growth by Plasma-enhanced CVD : Gas-phase, Surface and In-film Reactions for High-quality Film Formation.
- Source :
- Vacuum & Surface Science; 2024, Vol. 67 Issue 2, p44-51, 8p
- Publication Year :
- 2024
-
Abstract
- We overview plasma-enhanced chemical vaper deposition (PECVD) of high-quality thin-film silicon. In PECVD, such a film is grown by the deposition of precursors, which is generated by the gas-phase reactions of source gases in plasma. The growth of the film depends on the surface reactions of precursors and the reactions in the growing film, i.e., in-film reactions, which influences the film structure and properties. The in-film reactions also take place after the growth, i.e., post-growth annealing. So, the reactions should be properly controlled throughout the growth and annealing for the high-quality film formation. Here, the growth kinetics and related reactions are presented for devicegrade hydrogenated amorphous silicon (a-Si:H) films. [ABSTRACT FROM AUTHOR]
Details
- Language :
- Chinese
- ISSN :
- 24335835
- Volume :
- 67
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Vacuum & Surface Science
- Publication Type :
- Academic Journal
- Accession number :
- 175971192
- Full Text :
- https://doi.org/10.1380/vss.67.44