Deposition and dielectric characterization of highly oriented V2O5 thin films.

MLA

Jacques, Leonard, et al. “Deposition and Dielectric Characterization of Highly Oriented V2O5 Thin Films.” MRS Communications, vol. 14, no. 1, Feb. 2024, pp. 76–81. EBSCOhost, https://doi.org/10.1557/s43579-023-00502-7.

APA

Jacques, L., Shetty, S., Vega, F. J., Liu, Y., Aronson, B., Beechem, T., & Trolier-McKinstry, S. (2024). Deposition and dielectric characterization of highly oriented V2O5 thin films. MRS Communications, 14(1), 76–81. https://doi.org/10.1557/s43579-023-00502-7

Chicago

Jacques, Leonard, Smitha Shetty, Fernando Josue Vega, Yongtao Liu, Benjamin Aronson, Thomas Beechem, and Susan Trolier-McKinstry. 2024. “Deposition and Dielectric Characterization of Highly Oriented V2O5 Thin Films.” MRS Communications 14 (1): 76–81. doi:10.1557/s43579-023-00502-7.