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Demonstration of transfer learning using 14nm technology analog ReRAM array.

Authors :
Athena, Fabia Farlin
Fagbohungbe, Omobayode
Nanbo Gong
Rasch, Malte J.
Penaloza, Jimmy
SoonCheon Seo
Gasasira, Arthur
Solomon, Paul
Bragaglia, Valeria
Consiglio, Steven
Hisashi Higuchi
Park, Chanro
Brew, Kevin
Jamison, Paul
Catano, Christopher
Saraf, Iqbal
Silvestre, Claire
Xuefeng Liu
Khan, Babar
Jain, Nikhil
Source :
Frontiers in Electronics; 2024, p1-9, 9p
Publication Year :
2024

Abstract

Analog memory presents a promising solution in the face of the growing demand for energy-efficient artificial intelligence (AI) at the edge. In this study, we demonstrate efficient deep neural network transfer learning utilizing hardware and algorithm co-optimization in an analog resistive random-access memory (ReRAM) array. For the first time, we illustrate that in open-loop deep neural network (DNN) transfer learning for image classification tasks, convergence rates can be accelerated by approximately 3.5 times through the utilization of cooptimized analog ReRAM hardware and the hardware-aware Tiki-Taka v2 (TTv2) algorithm. A simulation based on statistical 14 nm CMOS ReRAM array data provides insights into the performance of transfer learning on larger network workloads, exhibiting notable improvement over conventional training with random initialization. This study shows that analog DNN transfer learning using an optimized ReRAM array can achieve faster convergence with a smaller dataset compared to training from scratch, thus augmenting AI capability at the edge. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
26735857
Database :
Complementary Index
Journal :
Frontiers in Electronics
Publication Type :
Academic Journal
Accession number :
175218854
Full Text :
https://doi.org/10.3389/felec.2023.1331280