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Numerical Analysis of the Thermal and Mechanical Performance of Cu Pillar Bumps During Reflow: Effects of Height and Solder Material.

Authors :
Lee, Jing Rou
Chong, Mun Xi
Abdul Aziz, Mohd Sharizal
Khor, Chu Yee
Mohd Salleh, Mohd Arif Anuar
Mohd Arif Zainol, Mohd Remy Rozainy
Ani, F. Che
Source :
Journal of Electronic Materials; Mar2024, Vol. 53 Issue 3, p1169-1182, 14p
Publication Year :
2024

Abstract

This paper investigates the impact of various copper (Cu) pillar bump heights on temperature distribution, deformation and thermal stress during reflow. The virtual reflow oven environment was simulated using the fluid domain of the oven model. The accuracy of the fluid analysis was verified by comparing the obtained results with experimental data, which was conducted based on the Joint Electron Device Engineering Council (JEDEC) Standard. In addition, a grid independence test was carried out on the fluid mesh to determine the optimal mesh size for the simulations. A thermal fluid–structure interaction (FSI) approach was employed to couple the thermal results from the fluid analysis with the solid assembly. The results of the coupling analysis revealed that Cu pillar bumps with a height of 0.09 mm exhibited the lowest reflow temperature, minimal maximum deformation, and thermal stress, indicating that it is the optimal potential height for forming a good joint. The study also examines the impact of soldering materials, such as tin-bismuth (SnBi) and tin-silver-copper solder alloys (SAC305 and SAC405), on the Cu pillar bump. This study enables a comprehensive analysis of the thermal and mechanical performance of different Cu pillar bump parameters during the reflow process. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
53
Issue :
3
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
175199731
Full Text :
https://doi.org/10.1007/s11664-023-10782-3