Cite
From Anomaly Detection to Defect Classification.
MLA
Klarák, Jaromír, et al. “From Anomaly Detection to Defect Classification.” Sensors (14248220), vol. 24, no. 2, Jan. 2024, p. 429. EBSCOhost, https://doi.org/10.3390/s24020429.
APA
Klarák, J., Andok, R., Malík, P., Kuric, I., Ritomský, M., Klačková, I., & Tsai, H.-Y. (2024). From Anomaly Detection to Defect Classification. Sensors (14248220), 24(2), 429. https://doi.org/10.3390/s24020429
Chicago
Klarák, Jaromír, Robert Andok, Peter Malík, Ivan Kuric, Mário Ritomský, Ivana Klačková, and Hung-Yin Tsai. 2024. “From Anomaly Detection to Defect Classification.” Sensors (14248220) 24 (2): 429. doi:10.3390/s24020429.