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Ferroelectric properties of vanadium substituted four-layer Aurivillius compound Bi5Fe1.5V0.5Ti2O15 thin films.

Authors :
Prajapat, Deepak
Surampalli, Akash
Upadhyay, Sanjay Kumar
Reddy, V. Raghavendra
Source :
Ferroelectrics; 2024, Vol. 618 Issue 2, p512-517, 6p
Publication Year :
2024

Abstract

We report the preparation and characterization of vanadium substituted four-layer Aurivillius compound Bi<subscript>5</subscript>Fe<subscript>1.5</subscript>V<subscript>0.5</subscript>Ti<subscript>2</subscript>O<subscript>15</subscript> using spin coating method. Ferroelectricity in the prepared films are confirmed from the well saturated polarization vs electric field (P-E) loops having remnant polarization (2 P<subscript>r</subscript>) around 12.94 µC/cm<superscript>2</superscript> at room temperature. In addition, low temperature P-E measurements show a decrease in P<subscript>max</subscript> and 2 P<subscript>r</subscript>, which is attributed to the stabilization of defect dipole complexes and domain pinning, as seen in bismuth-based ferroelectrics. Additionally, this decrease in polarization is accompanied by an increase in imprint, confirming the presence of defect dipoles manifested as internal fields. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00150193
Volume :
618
Issue :
2
Database :
Complementary Index
Journal :
Ferroelectrics
Publication Type :
Academic Journal
Accession number :
175069607
Full Text :
https://doi.org/10.1080/00150193.2023.2273727