Analysis of superconducting silicon epilayers by atom probe tomography: composition and evaporation field.

MLA

Hoummada, Khalid, et al. “Analysis of Superconducting Silicon Epilayers by Atom Probe Tomography: Composition and Evaporation Field.” European Physical Journal - Applied Physics, vol. 98, Jan. 2023, pp. 1–8. EBSCOhost, https://doi.org/10.1051/epjap/2023230018.

APA

Hoummada, K., Dahlem, F., Panciera, F., Bustarret, E., Marcenat, C., Débarre, D., El Amraoui, Y., & Mangelinck, D. (2023). Analysis of superconducting silicon epilayers by atom probe tomography: composition and evaporation field. European Physical Journal - Applied Physics, 98, 1–8. https://doi.org/10.1051/epjap/2023230018

Chicago

Hoummada, Khalid, Franck Dahlem, Federico Panciera, Etienne Bustarret, C. Marcenat, Dominique Débarre, Youssef El Amraoui, and Dominique Mangelinck. 2023. “Analysis of Superconducting Silicon Epilayers by Atom Probe Tomography: Composition and Evaporation Field.” European Physical Journal - Applied Physics 98 (January): 1–8. doi:10.1051/epjap/2023230018.