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Effect of point defects on electrochemical performances of α-Ga2O3 microrods prepared with hydrothermal process for supercapacitor application.
- Source :
- Journal of Materials Science: Materials in Electronics; Jan2024, Vol. 35 Issue 2, p1-14, 14p
- Publication Year :
- 2024
-
Abstract
- α-Ga<subscript>2</subscript>O<subscript>3</subscript> microrods was deposited on carbon cloth (CC) using a hydrothermal process followed by a high-temperature annealing in air. The microstructure of the obtained Ga<subscript>2</subscript>O<subscript>3</subscript>/CC composite electrodes were characterized with scanning electron microscopy, X-ray diffraction, and X-ray photoelectron spectroscopy. Their electrochemical performances were tested with electrochemical impedance spectroscopy (EIS), Mott-Schottky (MS), cyclic voltammetry (CV) and galvanostatic charge/discharge techniques (GCD). By comparing the electron densities and mobilities of the Ga<subscript>2</subscript>O<subscript>3</subscript>/CC electrodes prepared with different hydrothermal durations, the doping mechanisms of point defects in α-Ga<subscript>2</subscript>O<subscript>3</subscript> were revealed. The point defects in α-Ga<subscript>2</subscript>O<subscript>3</subscript> including Ga-oxygen vacancies (Ga-V<subscript>O</subscript>), gallium vacancies (V<subscript>Ga</subscript>), and V<subscript>Ga</subscript>-V<subscript>O</subscript> complexes were all identified as the scattering centers. By extending the hydrothermal duration to more than 6 h, the electronic conductivity of the Ga<subscript>2</subscript>O<subscript>3</subscript>/CC electrode was enhanced by reducing the number of point defects in α-Ga<subscript>2</subscript>O<subscript>3</subscript>. The Ga<subscript>2</subscript>O<subscript>3</subscript>/CC-6h aqueous symmetrical supercapacitor (SC) showed a remarkable increase in the electrochemical performance by exhibiting a specific areal capacitance of 1394 mF cm<superscript>−2</superscript> at 0.5 mA cm<superscript>−2</superscript>, with 67% of the capacitance retained when the current density was increased to 20 mA cm<superscript>−2</superscript>, and 76.5% of capacitance retention after 20,000 cycles under a current density of 10 mA cm<superscript>−2</superscript>. The point defect mechanism identified in the article would pave the way to develop novel energy storage devices based on α-Ga<subscript>2</subscript>O<subscript>3</subscript> in the future. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 09574522
- Volume :
- 35
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Journal of Materials Science: Materials in Electronics
- Publication Type :
- Academic Journal
- Accession number :
- 174963162
- Full Text :
- https://doi.org/10.1007/s10854-023-11881-x