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Three-dimensional integration of two-dimensional field-effect transistors.

Authors :
Jayachandran, Darsith
Pendurthi, Rahul
Sadaf, Muhtasim Ul Karim
Sakib, Najam U
Pannone, Andrew
Chen, Chen
Han, Ying
Trainor, Nicholas
Kumari, Shalini
Mc Knight, Thomas V.
Redwing, Joan M.
Yang, Yang
Das, Saptarshi
Source :
Nature; Jan2024, Vol. 625 Issue 7994, p276-281, 6p
Publication Year :
2024

Abstract

In the field of semiconductors, three-dimensional (3D) integration not only enables packaging of more devices per unit area, referred to as ‘More Moore’1 but also introduces multifunctionalities for ‘More than Moore’2 technologies. Although silicon-based 3D integrated circuits are commercially available3–5, there is limited effort on 3D integration of emerging nanomaterials6,7 such as two-dimensional (2D) materials despite their unique functionalities7–10. Here we demonstrate (1) wafer-scale and monolithic two-tier 3D integration based on MoS<subscript>2</subscript> with more than 10,000 field-effect transistors (FETs) in each tier; (2) three-tier 3D integration based on both MoS<subscript>2</subscript> and WSe<subscript>2</subscript> with about 500 FETs in each tier; and (3) two-tier 3D integration based on 200 scaled MoS<subscript>2</subscript> FETs (channel length, L<subscript>CH</subscript> = 45 nm) in each tier. We also realize a 3D circuit and demonstrate multifunctional capabilities, including sensing and storage. We believe that our demonstrations will serve as the foundation for more sophisticated, highly dense and functionally divergent integrated circuits with a larger number of tiers integrated monolithically in the third dimension.Monolithic three-dimensional integration of two-dimensional field-effect transistors enables improved integration density and multifunctionality to realize ‘More Moore’ and ‘More than Moore’ technologies. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00280836
Volume :
625
Issue :
7994
Database :
Complementary Index
Journal :
Nature
Publication Type :
Academic Journal
Accession number :
174725124
Full Text :
https://doi.org/10.1038/s41586-023-06860-5