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Vertical 1T'‐WTe2/WS2 Schottky‐Barrier Phototransistor with Polarity‐Switching Behavior.

Authors :
Ma, Jingyi
Wang, Jina
Chen, Quan
Chen, Shengdi
Yang, Mengmeng
Sun, Yiming
Zheng, Zhaoqiang
Huo, Nengjie
Yan, Yong
Li, Jingbo
Gao, Wei
Source :
Advanced Electronic Materials; Jan2024, Vol. 10 Issue 1, p1-13, 13p
Publication Year :
2024

Abstract

In recent years, 2D reconfigurable phototransistors (RPTs) have been applied in broadband convolutional processing, retinomorphic hardware devices, and non‐volatile memorizers. However, there has been a lack of investigation into all‐2D Schottky junctions used in RPT with polarity control behavior. Herein, a vertically stacked multilayered WS2/WTe2 Schottky RPT is reported. The semimetal characteristics of 1T'‐WTe2 is designed to form a built‐in electric field of 69 meV across the heterojunction and WS2 exhibits gate‐tunable characteristics. Therefore, reconfigurable rectifying behavior and self‐driven bidirectional photo response can be achieved. The phototransistor possesses a gate‐tunable rectification ratio ranging from 10−2 to 105, and the corresponding logic half‐wave rectifier shows excellent switchable rectifying states. Under 635 nm illumination, the responsivity can be adjusted from −1325 to 430 mA W−1 with reversed signs. Meanwhile, the maximum power conversion efficiency is 2.84%, and the specific detectivity is 1.47 × 1012 Jones. The device shows both negative and positive responsivity with linear gate dependence within a voltage window of 10 V. Impressively, nonvolatile photovoltaic performance can be demonstrated by reversing short‐circuit current and open‐circuit voltage by applying and releasing pulsed gate voltage. Finally, reconfigurable polarization behavior, single‐pixel imaging, and the optical logic circuit are applicable to the heterostructure. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
2199160X
Volume :
10
Issue :
1
Database :
Complementary Index
Journal :
Advanced Electronic Materials
Publication Type :
Academic Journal
Accession number :
174713623
Full Text :
https://doi.org/10.1002/aelm.202300672