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Functional Pattern-Related Anomaly Detection Approach Collaborating Binary Segmentation with Finite State Machine.

Authors :
MingWan
MingleiHao
Jiawei Li
JiangyuanYao
Yan Song
Source :
Computers, Materials & Continua; 2023, Vol. 77 Issue 3, p3573-3592, 20p
Publication Year :
2023

Abstract

The process control-oriented threat, which can exploit OT (Operational Technology) vulnerabilities to forcibly insert abnormal control commands or status information, has become one of the most devastating cyber attacks in industrial automation control. To effectively detect this threat, this paper proposes one functional patternrelated anomaly detection approach, which skillfully collaborates the BinSeg (Binary Segmentation) algorithm with FSM (Finite State Machine) to identify anomalies between measuring data and control data. By detecting the change points of measuring data, the BinSeg algorithm is introduced to generate some initial sequence segments, which can be further classified and merged into different functional patterns due to their backward difference means and lengths. After analyzing the pattern association according to the Bayesian network, one functional state transition model based on FSM, which accurately describes the whole control and monitoring process, is constructed as one feasible detection engine. Finally, we use the typical SWaT (SecureWater Treatment) dataset to evaluate theproposedapproach, and the experimental results showthat: for one thing, comparedwithother changepoint detection approaches, the BinSeg algorithm can be more suitable for the optimal sequence segmentation of measuring data due to its highest detection accuracy and least consuming time; for another, the proposed approach exhibits relatively excellent detection ability, because the average detection precision, recall rate and F1-score to identify 10 different attacks can reach 0.872, 0.982 and 0.896, respectively. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
15462218
Volume :
77
Issue :
3
Database :
Complementary Index
Journal :
Computers, Materials & Continua
Publication Type :
Academic Journal
Accession number :
174550093
Full Text :
https://doi.org/10.32604/cmc.2023.044857