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Novel Approach to Microcrack-Free Thick YBa2Cu3O7-δ Films on γ-Cut Sapphire Buffered With CeO2.
- Source :
- IEEE Transactions on Applied Superconductivity; Jun2005 Part 3 of 3, Vol. 15 Issue 2, p2958-2961, 4p
- Publication Year :
- 2005
-
Abstract
- Stoichiometric YBa<subscript>2</subscript>Cu<subscript>3</subscript>O<subscript>7-δ</subscript> (YBCO) films were fabricated by pulsed laser deposition on deliberately miscut Al<subscript>2</subscript>O<subscript>3</subscript> (1...102) buffered with CeO<subscript>2</subscript>. Atomic force microscopy observations demonstrated that 600 nm-thick YBCO films were microcrack-free. Characterization of the films revealed a porous morphology, consisting of interconnected islands and deep holes (pores). This feature is considered as one of the sources contributing to the strain-relieving mechanism responsible for the increase in film thickness without microcracking. We observed T<subscript>c</subscript> = 90±0.5K, J<subscript>c</subscript>(77.3K, 0 T) = 1.5 - 2.0 × 10<superscript>6</superscript> A/cm², and J<subscript>c</subscript>t(77.3 K, 0 T) ∼ 120 A/cm. In addition, this new approach, using the deliberately miscut sapphire as a substrate for YBCO, is also applicable to other kinds of deposition techniques. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 10518223
- Volume :
- 15
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Applied Superconductivity
- Publication Type :
- Academic Journal
- Accession number :
- 17429979
- Full Text :
- https://doi.org/10.1109/TASC.2005.848681