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Diffraction tomography based on Fourier ptychographic microscopy with the multiple scattering model.
- Source :
- Proceedings of SPIE; 1/6/2024, Vol. 12768, p127681N-127681N-26, 1p
- Publication Year :
- 2024
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 12768
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 174066243
- Full Text :
- https://doi.org/10.1117/12.2687531