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Photoelectron holographic evidence for the incorporation site of Se and suppressed atomic displacement of the conducting layer of La(O,F)BiSSe.
- Source :
- Japanese Journal of Applied Physics; 12/10/2023, Vol. 62 Issue 12, p1-6, 6p
- Publication Year :
- 2023
-
Abstract
- La(O,F)BiS<subscript>2- x </subscript>Se<subscript> x </subscript> is a layered material that is considered to be a candidate exotic superconductor as well as a promising thermoelectrical material. We performed soft X-ray photoelectron holography to study the Se incorporation site and the local atomic arrangement of the conducting layer. A comparison of the experimental holograms with the simulated holograms indicates that Se atoms preferentially occupy the S sites in the conducting Bi–S plane of La(O,F)BiS<subscript>2</subscript>. A comparison between the state-of-the-art holographic reconstructions of La(O,F)BiSSe and La(O,F)BiS<subscript>2</subscript> suggests that Se substitution suppresses the displacement of S atoms in La(O,F)BiS<subscript>2</subscript>. These results provide photoelectron holographic evidence for the Se incorporation site and the Se-induced suppression of in-plane disorder. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00214922
- Volume :
- 62
- Issue :
- 12
- Database :
- Complementary Index
- Journal :
- Japanese Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 173890447
- Full Text :
- https://doi.org/10.35848/1347-4065/ad079b