Adhesion Strength of the Interface between Solid Phases in the GaxGe40–xS60–Quartz Glass System.

Using normal pull-off testing, we have studied adhesion contact strength in the Ga_xGe_40–xS₆₀–quartz glass system as a function of contact formation temperature, pull-off test temperature, and chalcogenide glass composition. The addition of 1 at % gallium to glass composition considerably reduces the adhesion strength. Further increasing the percentage of gallium, to 8 at %, causes only a slight drop in adhesion. The observed general relationships can be accounted for by partial glass crystallization on heating for adhesion contact formation and subsequent cooling to the pull-off test temperature. We have formulated recommendations concerning detachment of Ga_xGe_40–xS₆₀ glasses from the quartz reactor wall. [ABSTRACT FROM AUTHOR]