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A Software Testing Workflow Analysis Tool Based on the ADCV Method.

Authors :
Mao, Zijian
Han, Qiang
He, Yu
Li, Nan
Li, Cong
Shan, Zhihui
Han, Sheng
Source :
Electronics (2079-9292); Nov2023, Vol. 12 Issue 21, p4464, 23p
Publication Year :
2023

Abstract

Based on two progressive aspects of the modeling problems in business process management (BPM), (1) in order to address the increasing complexity of user requirements on workflows underlying various BPM application scenarios, a more verifiable fundamental modeling method must be invented; (2) to address the diversification of software testing processes, more formalized advanced modeling technology must also be applied based on the fundamental modeling method. Aiming to address these modeling problems, this paper first proposes an ADCV (acquisition, decomposition, combination, and verification) method that runs through the core management links of four types of business processes (mining, decomposition, recombination, and verification) and then describes the compositional structure of the ADCV method and the design of corresponding algorithms. Then, the software testing workflow is managed and monitored using the method, and the corresponding analysis tool is implemented based on Petri nets. At the same time, the tool is applied to the case processing of the software testing workflow. Specifically, the workflow models are established successively through ADCV during the process of business iteration. Then, the analysis tool developed with the ADCV method, the model–view–controller (MVC) design pattern, and Java Swing technology are applied to instances of the software testing workflow to realize the modeling and management of the testing processes. Thus, the analysis tool can guarantee the accuracy of the parameter estimations of related software reliability growth models (SRGMs) and ultimately improve the quality of software products. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20799292
Volume :
12
Issue :
21
Database :
Complementary Index
Journal :
Electronics (2079-9292)
Publication Type :
Academic Journal
Accession number :
173568412
Full Text :
https://doi.org/10.3390/electronics12214464