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Probing charge traps at the 2D semiconductor/dielectric interface.
- Source :
- Nanoscale; 11/14/2023, Vol. 15 Issue 42, p16818-16835, 18p
- Publication Year :
- 2023
Details
- Language :
- English
- ISSN :
- 20403364
- Volume :
- 15
- Issue :
- 42
- Database :
- Complementary Index
- Journal :
- Nanoscale
- Publication Type :
- Academic Journal
- Accession number :
- 173412187
- Full Text :
- https://doi.org/10.1039/d3nr03453d