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Enhanced Microwave Dielectric Properties of the Ba2TiSi2O8 Ceramic by the Addition of TiO2.

Authors :
Abreu, R. F.
Saturno, S. O.
da M. Colares, D.
Silva, F. R.
Nobrega, F. A. C.
Nogueira, F. E. A
do Nascimento, J. P. C
Vasconcelos, S. J. T.
do Carmo, F. F.
Abreu, T. O.
Ghosh, A.
Sales, J. C.
Silva, R. S.
Sales, A. J. M.
Silva, M. A. S.
Sombra, A. S. B.
Source :
Journal of Electronic Materials; Dec2023, Vol. 52 Issue 12, p8050-8064, 15p
Publication Year :
2023

Abstract

This work studies the dielectric properties in the microwave region (MW) of the Ba<subscript>2</subscript>TiSi<subscript>2</subscript>O<subscript>8</subscript> (BTS) ceramic with TiO<subscript>2</subscript> additions and its applications as a dielectric resonator antenna (DRA). In this study, structural characterization through x-ray diffraction (XRD) is performed and the Rietveld refinement is used to confirm the phases formed. Analysis of the morphology of the materials is performed using scanning electron microscopy (SEM). The resonant frequency temperature coefficient (τ<subscript>f</subscript>) reveals a variation from − 47.0 ppm°C<superscript>−1</superscript> to + 16.5 ppm°C<superscript>−1</superscript>. The dielectric properties in the MW region reveal an increase in the dielectric permittivity (ε<subscript>r</subscript>) and a decrease in the loss tangent (tanδ) of the samples. Numerical simulation shows good fits of the experimental data, with gain and directivity standing out, ranging from 4 dBi to 6 dBi and radiation efficiency below 80%. The results demonstrate that the samples can operate in C-band electronics, Wi-Fi devices, meteorological radar systems, etc. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
52
Issue :
12
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
173396432
Full Text :
https://doi.org/10.1007/s11664-023-10718-x