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Variable-angle, spectroscopic ellipsometry study on the repeated application of first contact polymer on silicon-based surfaces.

Authors :
Vawdrey, Joshua J.
Hamilton, James P.
Allred, David D.
Source :
Proceedings of SPIE; 9/26/2023, Vol. 12666, p1266609-1266609, 1p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12666
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
173345566
Full Text :
https://doi.org/10.1117/12.2692390