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Status of testing and characterization of the Speedster-EXD550 x-ray hybrid CMOS detector.
- Source :
- Proceedings of SPIE; 10/8/2023, Vol. 12678, p126780O-126780O-5, 1p
- Publication Year :
- 2023
Details
- Language :
- English
- ISSN :
- 0277786X
- Volume :
- 12678
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 173283138
- Full Text :
- https://doi.org/10.1117/12.2676983