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Imaging Defects in Nanometer-scale Semiconductor Crystals: Statistical Nucleation Events are Few in Small Crystals, but can Control Growth.
- Source :
- Microscopy & Microanalysis; 2005 Supplement, Vol. 11, p1622-1623, 2p
- Publication Year :
- 2005
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 11
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 173211049
- Full Text :
- https://doi.org/10.1017/S1431927605502046