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Effect of the Annealing Conditions on the Formation of a Nanocrystalline Phase in TiOx Films.

Authors :
Nezhdanov, A. V.
Zhukov, A. O.
Shestakov, D. V.
Vinogradova, L. M.
Skrylev, A. A.
Ershov, A. V.
Pavlov, D. A.
Andrianov, A. I.
Markelov, A. S.
De Filpo, G.
Baratta, M.
Mashin, A. I.
Source :
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Oct2023, Vol. 17 Issue 5, p1078-1082, 5p
Publication Year :
2023

Abstract

The annealing of amorphous TiO<subscript>x</subscript> films obtained by electron-beam evaporation under atmospheric conditions at temperatures from 300 to 400°C is found to lead to the formation of an anatase crystalline phase. According to Raman spectroscopy data, the increase in the fraction of the crystalline phase stops at an annealing temperature above 350°C. According to the results of X-ray diffraction analysis, the average crystallite diameter is about 23 nm. Electron-microscopy studies show that, upon annealing, the surface layer (15 nm thick) crystallizes in the films, and TiO<subscript>2</subscript> nanocrystals with sizes from 4 to 10 nm are formed in the bulk. As the depth increases, the number of nanocrystals decreases. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10274510
Volume :
17
Issue :
5
Database :
Complementary Index
Journal :
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques
Publication Type :
Academic Journal
Accession number :
173050574
Full Text :
https://doi.org/10.1134/S1027451023050294