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Thermal stability study of gallium nitride based magnetic field sensor.

Authors :
Shetty, Satish
Kuchuk, Andrian
Zamani-Alavijeh, Mohammad
Hassan, Ayesha
Eisner, Savannah R.
Maia de Oliveira, Fernando
Krone, Alexis
Harris, John
Thompson, Josh P.
Eldose, Nirosh M.
Mazur, Yuriy I.
Huitink, David
Senesky, Debbie G.
Alan Mantooth, H.
Salamo, Gregory J.
Source :
Journal of Applied Physics; 10/14/2023, Vol. 134 Issue 14, p1-9, 9p
Publication Year :
2023

Abstract

We investigated the thermal stability and performance of AlGaN/AlN/GaN Hall-effect sensors under industry-relevant atmospheric conditions. The thermal stability and performance of Hall sensors are evaluated by monitoring Hall sensitivity, two-dimensional electron gas density, and Ohmic contact resistance during aging at 200 °C for up to 2800 h under atmospheric conditions. This was accomplished by characterizing AlGaN/AlN/GaN micro-Hall sensors, with and without contacts, and before and after being placed under different thermal aging times. Observed electrical performance was correlated with the micro-structural evolution of AlGaN/AlN/GaN Hall sensor heterostructures. Results indicate that the AlGaN/AlN/GaN Hall sensor provides stable performance for as long as 2800 h aging at 200 °C without any significant degradation of (i) Hall sensitivity, (ii) two-dimensional electron gas, and (iii) Ohmic contacts. However, there was a small change in sheet density and mobility, which is due to a decrease in polarization, resulting from local inhomogeneous strain relief at the barrier layer. During the early stage of thermal aging, a decrease in contact resistance was also observed and attributed to (i) out-diffusion of "Ga" at the vicinity of the contact interface, and (ii) a reduction in oxygen concentration and formation of Al–Ti intermediate alloy at the GaN/Ti interface, resulting in a reduced barrier and enhanced electron transport at the contacts. However, despite these small changes, results indicate that the AlGaN/AlN/GaN Hall sensor provides stable performance for as long as 2800 h thermal aging at 200 °C. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
134
Issue :
14
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
172990421
Full Text :
https://doi.org/10.1063/5.0156013