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A direct experimental comparison of single-crystal CVD diamond and silicon carbide X-ray beam position monitors.
- Source :
- Journal of Synchrotron Radiation; Sep2023, Vol. 30 Issue 5, p876-884, 9p
- Publication Year :
- 2023
-
Abstract
- Single-crystal chemical vapour deposition (CVD) diamond detectors are an established transmissive synchrotron beamline diagnostic instrument used for beam position and beam intensity monitoring. A recently commercialized alternative is silicon carbide (4H-SiC) devices. These have the potential to provide the same diagnostic information as commercially available single-crystal CVD diamond X-ray beam position monitors, but with a much larger transmissive aperture. At Diamond Light Source an experimental comparison of the performance of single-crystal CVD diamond and 4H-SiC X-ray beam position monitors has been carried out. A quantitative comparison of their performance is presented in this paper. The single-crystal diamond and 4H-SiC beam position monitors were installed in-line along the synchrotron X-ray beam path enabling synchronous measurements at kilohertz rates of the beam motion from both devices. The results of several tests of the two position monitors' performance are presented: comparing signal uniformity across the surface of the detectors, comparing kHz intensity measurements, and comparing kHz beam position measurements from the detectors. Each test is performed with a range of applied external bias voltages. A discussion of the benefits and limitations of 4H-SiC and single-crystal CVD diamond detectors is included. [ABSTRACT FROM AUTHOR]
- Subjects :
- SILICON carbide
CHEMICAL vapor deposition
DIAMONDS
X-rays
LIGHT sources
Subjects
Details
- Language :
- English
- ISSN :
- 09090495
- Volume :
- 30
- Issue :
- 5
- Database :
- Complementary Index
- Journal :
- Journal of Synchrotron Radiation
- Publication Type :
- Academic Journal
- Accession number :
- 172859746
- Full Text :
- https://doi.org/10.1107/S1600577523005623