Impact of Back-Gate Radiation on Single-Event Effects of Ultrathin Body and Buried Oxide Fully Depleted Silicon-on-Insulator MOSFETs.

MLA

Wu, Zhenyu, et al. “Impact of Back-Gate Radiation on Single-Event Effects of Ultrathin Body and Buried Oxide Fully Depleted Silicon-on-Insulator MOSFETs.” Journal of Electronic Materials, vol. 52, no. 11, Nov. 2023, pp. 7496–503. EBSCOhost, https://doi.org/10.1007/s11664-023-10680-8.

APA

Wu, Z., Peng, C., Liu, M., & Liu, B. (2023). Impact of Back-Gate Radiation on Single-Event Effects of Ultrathin Body and Buried Oxide Fully Depleted Silicon-on-Insulator MOSFETs. Journal of Electronic Materials, 52(11), 7496–7503. https://doi.org/10.1007/s11664-023-10680-8

Chicago

Wu, Zhenyu, Chaoqun Peng, Menglong Liu, and Binyang Liu. 2023. “Impact of Back-Gate Radiation on Single-Event Effects of Ultrathin Body and Buried Oxide Fully Depleted Silicon-on-Insulator MOSFETs.” Journal of Electronic Materials 52 (11): 7496–7503. doi:10.1007/s11664-023-10680-8.