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Quantifizierung der Klassifikationsleistung von Oberflächeninspektionssystemen in der Flachstahlproduktion.

Authors :
Brandenburger, Jens
Krippendorff, Fabian
Krätzner, Michael
Nörtersheuser, Michael
Chen, Xin
Boss, Andreas
Jonker, Kees
Pipard, Nicolas
Ebner, Andreas
Source :
Technisches Messen; Oct2023, Vol. 90 Issue 10, p650-658, 9p
Publication Year :
2023

Abstract

<i>Copyright of Technisches Messen is the property of De Gruyter and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)

Details

Language :
German
ISSN :
01718096
Volume :
90
Issue :
10
Database :
Complementary Index
Journal :
Technisches Messen
Publication Type :
Academic Journal
Accession number :
172369099
Full Text :
https://doi.org/10.1515/teme-2023-0035