Survey on Sketch-to-photo Translation.

Subjects

Subjects :

DEEP learning
PATTERN recognition systems
TRANSLATING & interpreting
GENERATIVE adversarial networks
INFORMATION storage & retrieval systems

Details

Language :

English

ISSN :

03600300

Volume :

56

Issue :

1

Database :

Complementary Index

Journal :

ACM Computing Surveys

Publication Type :

Academic Journal

Accession number :

172340597

Full Text :

https://doi.org/10.1145/3606694