Cite
Applications of Scanned Probe Microscopy in the Integrated Circuit Fabrication Industry.
MLA
Bailey, Gw, et al. “Applications of Scanned Probe Microscopy in the Integrated Circuit Fabrication Industry.” Microscopy & Microanalysis, Apr. 1999, pp. 956–57. EBSCOhost, https://doi.org/10.1017/S1431927600018109.
APA
Bailey, G., Jerome, W., McKernan, S., Mansfield, J., Price, R., Richards, J. F., & Kline, R. (1999). Applications of Scanned Probe Microscopy in the Integrated Circuit Fabrication Industry. Microscopy & Microanalysis, 956–957. https://doi.org/10.1017/S1431927600018109
Chicago
Bailey, Gw, Wg Jerome, S McKernan, Jf Mansfield, Rl Price, J F Richards, and Rj Kline. 1999. “Applications of Scanned Probe Microscopy in the Integrated Circuit Fabrication Industry.” Microscopy & Microanalysis, April, 956–57. doi:10.1017/S1431927600018109.