A mini scanning device for profiling charged beams.

Authors :: Moretto-Capelle, P.
Panader, E.
Polizzi, L.
Champeaux, J. P.
Source :: Review of Scientific Instruments; Aug2023, Vol. 94 Issue 8, p1-7, 7p
Publication Year :: 2023
Abstract: In this article, we present the development of a mini scanner device to characterize the full transverse spatial density of a charged particle beam using computed tomography. The profiler consists of a wire mounted on a linear translator that can rotate around the beam. Tests were performed on a millimeter electron beam with 200 eV energy and 100 nA intensity, which allowed us to control and monitor both beam focusing and deflection. [ABSTRACT FROM AUTHOR]